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LANGER EMV-Technik GmbH

LANGER EMV-Technik GmbH

LANGER EMV-Technik GmbH

About LANGER EMV-Technik GmbH

Langer EMV-Technik GmbH is an electrical engineering company which carries out research, development and production in the field of electro-magnetic compatibility (EMC). Our EMC measurement technology and IC test systems are in demand worldwide for use in development, allowing the developers to open up new levels of quality in their products. In addition, we offer assistance in the solution of EMC challenges in module development. Our EMC strategies and our measurement processes ensure that EMC problems are rectified efficiently and at low cost – directly on the module for the most part. We pass on the knowledge thus acquired in practice-oriented EMC experience seminars. The company head office and production facilities are located in Bannewitz near Dresden.

Measuring Software (ChipScan-ESA)

Measuring Software (ChipScan-ESA)

Test Probes (A100)

Test Probes (A100)

To measure analogue signals with Bandwidth of 25 kHz under extreme interference conditions, measurement technology is needed that itself is not affected by disturbance fields (AS 100 Radiated immunity...

Test Probes (A200)

Test Probes (A200)

The AS 200 sensor allows isolated monitoring of electrical signals in the device under test without interaction to check that it functions correctly during EMC tests of electronic modules and devices...

Test Probes (A300)

Test Probes (A300)

The small AS 300 sensor measures level and signal wave shape changes with a bandwidth of 5 MHz without interaction during EMC tests. The sensor is immune to RF up to 200 V/m and is suitable for the an...

Burst Generator (E1)

Burst Generator (E1)

The E1 interference immunity development system is an ideal resource to optimize the EMC characteristics of modules in the final development phase. The E1 allows the developer to analyze interference...

RF shielding box (ESA1)

RF shielding box (ESA1)

The new RF shielding box for the ESA1 disturbance emission development system has an internal RF-filtered 110 – 230 V power supply. A measuring instrument can thus be operated in the shielding box and...

IC Scanner (FLS 102)

IC Scanner (FLS 102)

Burst Generators (Set P1)

Burst Generators (Set P1)

Near Field Probes (MFA01)

Near Field Probes (MFA01)

The sniffer probes in the MFA 01 set have special electrically shielded active micro probe heads with high resolution which have been designed for detailed magnetic field measurements in the layout, o...

Near Field Probes (RF1)

Near Field Probes (RF1)

The sniffer probes in the RF 1 set consist of different passive probe heads which have been designed for detailed magnetic or electric field measurements in the layout, on components and IC pins. The...

Near Field Probes (RF3)

Near Field Probes (RF3)

The sniffer probes in the RF 3mini set consist of two passive probe heads which have been designed for detailed magnetic fields measurements in the layout, on components and IC pins. The sniffer probe...

Near Field Probes (XF1)

Near Field Probes (XF1)

The sniffer probes in the XF 1 set consist of different passive probe heads which have been designed for detailed magnetic or electric field measurements in the layout, on components and IC pins. The...
Emission measurements with the NNB 21 line impedance stabilization network or HFW 21 RF current transformer and the ChipScan-ESA software for spectrum analyzers from Langer EMV-Technik GmbH

18.05.2016 00:05

Practical EMC tips
How to suppress interference on LVDS connections LVDS drivers (and LVDS receivers) can be the source of sig
The new AS 300 sensor has an immunity of 200 V/m at a transmission rate of 150 Mbps and a bandwidth of 5 MHz