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LANGER EMV-Technik GmbH

LANGER EMV-Technik GmbH

LANGER EMV-Technik GmbH

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Test Probes (A200) by LANGER EMV-Technik GmbH

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The AS 200 sensor allows isolated monitoring of electrical signals in the device under test without interaction to check that it functions correctly during EMC tests of electronic modules and devices under the influence of electromagnetic disturbance signals such as radiated interference according to IEC 61000-4-3 or conducted RF signals according to IEC 61000-4-6. This information allows you to draw conclusions about the nature of the respective EMC phenomena. Quick analyses as well as corresponding counter-measures will help you finish the development successfully.

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More Products in the Area of Test Probes

Test Probes (A100)

Test Probes (A100)

To measure analogue signals with Bandwidth of 25 kHz under extreme interference conditions, measurement technology is needed that itself is not affected by disturbance fields (AS 100 Radiated immunity...

Test Probes (A300)

Test Probes (A300)

The small AS 300 sensor measures level and signal wave shape changes with a bandwidth of 5 MHz without interaction during EMC tests. The sensor is immune to RF up to 200 V/m and is suitable for the an...

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