MICRO-EPSILON Messtechnik GmbH & Co. KG
22.09.2023 01:09
The IMS5420-TH white light interferometer opens up new perspectives in industrial thickness measurement of monocrystalline silicon wafers. Thanks to the broadband superluminescent diode (SLED), the IMS5420-TH can be used for undoped and doped as well as highly doped SI wafers. The thickness measurement range extends from 0.05 to 1.05 mm. The measurable thickness of air gaps is even up to 4 mm. The
highest precision is essential in the production of semiconductor wafers.
An important process step is the lapping of the blanks, which are thereby brought to a uniform thickness. The white light interferometers of the interferoMETER IMS5420 series were developed to continuously monitor the thickness.27.06.2024 01:05
Inspect small objects with outstanding 3D data qualityThe new measuring range of 30 mm complements the surfaceCONTROL 3D 3xx0 series of geometry, shape...
18.06.2024 06:30
How are tire geometries measured with laser sensors?Profile measurement and diameter determination of tires
Laser sensors from...
The optoNCDT 1900 laser triangulation sensors are used for automated displacement, distance and p...
28.05.2024 01:05
Confocal sensor systems now with PROFINET and EtherNet/IPConfocal chromatic sensor systems from Micro-Epsilon are unique worldwide and highly precise. The...
23.05.2024 01:00
Micro-Epsilon: High-precision measurement of technical mirrorsThe reflectCONTROL sensor is used when high-precision 3D measurements are required on reflective...