MICRO-EPSILON Messtechnik GmbH & Co. KG
21.03.2023 05:03
Carbon belts are cut into different widths in cutting machines. Exact measurement of each individual strip is necessary. 24 precision micrometers of the optoCONTROL 2520 series solve this measuring task with high linearity and a reproducibility of up to 5 µm.
One micrometer can measure several segments or strips simultaneously, record the results synchronously and then output them. Several sensors of the optoCONTROL 2520 series can be operated synchronously with each other. In strip applications and cutting machines, this allows segment measurements of several strips. In addition to the strip width, the simultaneous acquisition of further measured values such as the center position of the strips is possible. Often, smaller strips must also be measured within a few millimeters. For this purpose, the multi-segment mode of the ODC2520 optical micrometer records up to eight individual tapes within 46 mm or 95 mm without changing the measuring program.
Data output is fast and easy via analog and digital interfaces. The laser micrometers have integrated, modern interfaces such as Ethernet or EtherCAT as well as fieldbus extensions. The optoCONTROL micrometers are used for quality inspection in inline applications as well as in mechanical engineering. Hose and extrusion products such as bar stock or plastic tubes are also detected with high precision using laser micrometers.
Advantages at a glance
Synchronization of several precision micrometers
Fast data output via modern interfaces Ethernet, EtherCAT, RS422 as well as analog
Segment measurements of several bands simultaneously
Any bandwidth can be combined
Fast data output
20.11.2024 01:05
Confocal sensors: 5 convincing advantages
Suitable for confined installat...
15.11.2024 02:10
Inline thickness measurement with increased performance07.11.2024 01:05
Customized precision: The optoNCDT 1900 from Micro-EpsilonLaser sensors can be used to determine displacement, distance and position dynamically and precis...
05.11.2024 00:00
Thickness and structure measurement of solar wafers26.10.2024 01:05
Increased performance for scanCONTROL laser scannersThe performance of the scanCONTROL 3000 laser scanners has been increased: improved algorithms an...
15.10.2024 01:00
interferoMETER: High-performance sensors for special requirementsThree new sensors in the interferoMETER IMP-DS series are designed for high-precision distance me...