Dirk Steiner, Business Development Manager at Yxlon, has been intensively involved with industrial computed tomography since 2004 and has scanned and analyzed more than 1,000 data sets. Here you have the opportunity to watch the recording of Today's Metrology Live webinar by GIE Media and hear how demanding metrology tasks are reliably solved with computed tomography. Yxlon was present along with manufacturers of other metrology-related technologies to provide a comprehensive overview of solutions.

Dirk spoke about the latest trends in metrology using industrial computed tomography (CT) and how data is the key to getting the information manufacturers need to increase efficiency and reduce costs. The most important thing for manufacturers is the high quality of their products. At the 'round table', five participants discussed how their solutions can help producers achieve this. However, measuring and analyzing internal structures is only possible with CT.

In response to one of the questions posed, Dirk said, "CT is a non-tactile method, so we don't change the geometry in the process. We can see the internal structures, and with the big trend towards additive manufacturing today, there are no limits to what you can design and print. With CT, we can look inside and measure things that are either undercut or even hidden inside the part. In addition, we also get data from defects, internal defects, which in themselves have nothing to do with metrology. So we're killing two birds with one stone."