amtec Analysenmesstechnik GmbH

Manufacturer
Germany
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DIN EN ISO 9001:2008

Manufacturer
Germany
Website
Product inquiry
Phone

DIN EN ISO 9001:2008

X-Ray Fluorescence Spectrometers (MPD 2000) by amtec Analysenmesstechnik GmbH

With the help of the X-Ray fluorescence method, more tasks can be fulfilled than have been shown here so far. Another example shall be demonstrated by the multi element profile measuring system MPD 2000. First, the sample to be examined is angle grinded. A monochromatized X-ray beam strikes the sample in an angle that is smaller than the total reflection angle. This primary beam activates the fluorescence on the surface. The fluorescence radiation is received by an energy-dispersive detector for X-ray radiation. As the sample is moved linearly, the whole of the etched surface can be scanned.

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