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amtec Analysenmesstechnik GmbH

amtec Analysenmesstechnik GmbH

  • DIN EN ISO 9001:2008

amtec Analysenmesstechnik GmbH

  • DIN EN ISO 9001:2008

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Inline X-Ray Fluorescence Spectrometers (XRF 940 V) by amtec Analysenmesstechnik GmbH

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XRF 940V Instrument family for measurements of coatings under vacuum conditions
Measuring tasks:
  • Analysis of multiple layers, layer systems, alloy layers
  • Elements of the periodic system from (Na), Mg to U
  • Coating thickness range from nm to µm
  • Coating composition %, ‰

Fields of application
  • Solar cells such as CIS, CIGS, CdTe and others
  • Fuel cell
  • Corrosion protection
  • Contact layers
  • Magnetic layers
  • Barrier layers

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