Catalog
BECOME A PARTNER
BECOME A PARTNER
Catalog

amtec Analysenmesstechnik GmbH

amtec Analysenmesstechnik GmbH

  • DIN EN ISO 9001:2008

amtec Analysenmesstechnik GmbH

  • DIN EN ISO 9001:2008

Back to the overview

Inline X-Ray Fluorescence Spectrometers (XRF 940 V) by amtec Analysenmesstechnik GmbH

Product inquiry  

XRF 940V Instrument family for measurements of coatings under vacuum conditions
Measuring tasks:
  • Analysis of multiple layers, layer systems, alloy layers
  • Elements of the periodic system from (Na), Mg to U
  • Coating thickness range from nm to µm
  • Coating composition %, ‰

Fields of application
  • Solar cells such as CIS, CIGS, CdTe and others
  • Fuel cell
  • Corrosion protection
  • Contact layers
  • Magnetic layers
  • Barrier layers

Product inquiry  

By using this website you agree to our use of cookies as described in our Privacy Policy.
I Agree