Comet Yxlon GmbH

• Series: FF series
• Industry: Automotive, Electronics, Aerospace, Science & research, Semiconductors, Add. manufacturing
• Defect size: <1µm, <50µm, <1mm, >1mm
• Part Size: small size, medium size
• Mode of operation: 3D, 2D/3D, metrology

• Accurate material analyses in laboratory applications
• 2D detail visibility of down to 150 nm with 190 kV transmission tube
• Precise manipulation and temperature stability through granite base
• Intuitive Geminy graphical user interface with touchscreens
• Optional metrology version with an MPESD = 3.9 µm + L/75 [L in mm]
• Non-destructive testing with high energy

The smaller components become, the more important it is to achieve highly accurate, reliable X-ray and CT scans for quality assurance, process control, and small series inspections. The extremely compact high-resolution systems Comet Yxlon FF20 CT and FF20 CT Metrology are designed specifically for the inspection of very fine parts and internal structures. With comparatively high energy of 190 kV, even dense items can be analyzed to the smallest detail.

• Electronic components incl. SMD
• Semiconductor packages
• Battery cells
• Injection molded plastics
• Products involving new materials or new manufacturing methods, e.g., additively manufactured components, fiber-reinforced plastics
• Microsystems (MEMS, MOEMS)
• Medical objects, e.g., cannulas
• Geological, paleontological, and biological samples

• Quality assurance, material analysis, material research
• Failure and structure analysis
• Assembly checking
• Inspection of small serial productions
• Process control
• Digitization
• Segmentation