Catalog

Carl Zeiss IQS Deutschland GmbH

Carl Zeiss IQS Deutschland GmbH

Carl Zeiss IQS Deutschland GmbH

12.06.2024 01:06

ZEISS O-INSPECT duo

Microscope and measuring device in one

ZEISS O-INSPECT duo offers two technologies in one machine: large workpieces such as printed circuit boards, fuel cells or batteries can be both metrologically inspected and inspected in high resolution without cutting. The combination of 3D measurement technology and microscopic inspection increases efficiency and saves space in quality laboratories. ZEISS O-INSPECT duo is available in size 8/6/3


  • 2-in-1: Microscope and measuring device in one machine
  • Fast and precise 3D measurements - optical and tactile
  • High-resolution optics with additional inspection software ZEISS ZEN core

The first multi-technology system from ZEISS
ZEISS O-INSPECT duo is a measuring microscope that covers two essential areas of application in quality assurance: Precise measurement and high-resolution inspection of large or many small components. The device has also been specially developed for applications that require a combination of three-dimensional measurement and inspection - including segmentation, stitching and image processing on the color image. Quality laboratories now only need one machine instead of a measuring device and microscope, which saves space and system costs. Find out what other advantages the multifunctional device has for the respective areas.

MESSTECHNIK
High-precision measurements - tactile and optical
High accuracy for flat and sensitive workpieces
ZEISS O-INSPECT duo is a multi-sensor measuring device and impresses with its high-resolution optics paired with the ZEISS VAST XXT tactile scanning sensor. The tactile sensor enables fast and precise 3D measurements by capturing a large number of measuring points in a single movement.

Sensitive components can be measured without contact using ZEISS O-INSPECT duo - with excellent accuracy and a significant reduction in measuring time thanks to ZEISS VAST probing (ZVP). Thanks to the high resolution at a very large working distance, this is not only possible for flat workpieces or samples.

Surface inspection and measurement on a single machine
Today CMM, tomorrow microscope
Many workpieces require surface inspection in addition to dimensional, form and position inspection. Where previously two separate devices were used for measurement and inspection, ZEISS O-INSPECT duo now offers a 2-in-1 solution. Thanks to the intuitive operation of the device and the high-resolution 5 MP Discovery.V12 scout 160 c color camera sensor with 12x zoom lens, inspection tasks can now also be mapped on the measuring device. In addition to the usual use with ZEISS CALYPSO, the machine can also be used for microscopy tasks with the ZEISS ZEN core software.

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