ifm electronic GmbH
ifm electronic GmbH
27.10.2022 03:10
Object detection and object inspection in one device
Whether it's contour detection or BLOB analysis, the Dualis 2D vision sensor can handle a variety of defect testing and inspection applications throughout the manufacturing process. With higher resolution and many illumination features, even complex applications are now remarkably easy to solve.
What are typical applications?
The Dualis 2D vision sensor combines contour and blob analysis in one device.
It pays attention to every detail of both surfaces and contours, and can thus solve a wide range of defect testing and inspection applications throughout the manufacturing process.
Software and parameterisation
Easy parameterisation of vision sensors
The dualis is parameterised and programmed with the ifm Vision Assistant. The user is guided step by step through the parameterisation process in this intuitive software. The ready-made wizards make it easy for both beginners and experts to solve vision applications quickly and reliably and to implement them very simply.
With the so-called Logic Layer, image programming and logic operations can be performed. For experts in image processing, an advanced mode with numerous additional functions is included.
Experience the power of a vision system with the simplicity of a sensor.
Object detection and inspection in one device
Whether contour detection or BLOB analysis, the O2D5 family of sensors can solve a variety of defect testing and inspection applications throughout the manufacturing plant. Discover the features with the interactive model.
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